David J. Weiss

David J. Weiss is an American psychometrician who has made significant contributions to the field of psychometrics. Alongside Fredric M. Lord, Weiss is considered a pioneer in the development and application of computerized adaptive testing[1]

Weiss earned his bachelor's degree in psychology from the University of Pennsylvania in 1959. Thereafter, he pursued doctoral studies in the subject at the University of Minnesota, graduating in 1963.[2] After earning his doctorate, he remained and joined the faculty of the University of Minnesota.[3] Weiss is the founding editor-in-chief of the academic journal Applied Psychological Measurement, serving from January 1977 to December 2001.[4][5][6]

Weiss is a fellow of the American Psychological Association[7] and the American Educational Research Association.[8]

References

1. Segall, Daniel O. (2005). "Computerized Adaptive Testing". Encyclopedia of Social Measurement. 1 (1): 429–438. doi:10.1016/B0-12-369398-5/00444-8. ISBN 978-0-12-369398-3.
2. "David Weiss". University of Minnesota College of Liberal Arts. Retrieved 15 January 2025.
3. "David J Weiss". University of Minnesota. Retrieved 15 January 2025.
4. Weiss, David J. (January 1977). "Editor's Introduction". Applied Psychological Measurement. 1 (1): V–VI. doi:10.1177/014662167700100102. S2CID 220594920.
5. Weiss, David J. (March 1977). "Editor's Introduction". Applied Psychological Measurement. 1 (2): V–VI. doi:10.1177/014662167700100202. S2CID 220587184.
6. Weiss, David J. (December 2001). "New Apm Editor Now Accepting New Manuscript Submissions". Applied Psychological Measurement. 25 (4): 315–316. doi:10.1177/01466210122032154. S2CID 121179508.
7. "Div. 5 Fellows". American Psychological Association. Retrieved 14 August 2023.
8. "Fellow Members" (PDF). American Educational Research Association. Retrieved 14 January 2025.