The paper addresses the reliability problem of mobile ad hoc networks under link and node failure model. Node reliability is calculated as a function of no. of neighbor nodes, packet success rate, and device type and packet size. The presence of a link between any node pair is binary and its reliability is computed considering the distance between nodes and signal-to-noise ratio (SNR). An efficient algorithm is proposed to analyze and calculate the reliability of mobile ad hoc networks considering multiple routes from source and destination nodes. The effect of different parameters on node reliability and link reliability are analyzed and discussed. The network is simulated and analyzed using INET frame work. Reliability of two distinct cases of this simulation is evaluated. The simulated results and discussions ensure that evaluation of the reliability of any mobile ad hoc networks can be done easily and in an efficient manner by the proposed method.
Published by | Institute of Advanced Engineering and Science |
Journal Name | International Journal of Electrical and Computer Engineering (IJECE) |
Contact Phone | - |
Contact Name | Tole Sutikno |
Contact Email | ijece@iaesjournal.com |
Location | Kota yogyakarta, Daerah istimewa yogyakarta INDONESIA |
Website | IJECE| http://ijece.iaescore.com/index.php/IJECE| |
ISSN | ISSN : 20888708, EISSN : -, DOI : -, |
Core Subject | Science, Engineering, |
Meta Subject | Computer Science & IT, Electrical & Electronics Engineering, |
Meta Desc | International Journal of Electrical and Computer Engineering (IJECE, ISSN: 2088-8708, a SCOPUS indexed Journal, SNIP: 1.001; SJR: 0.296; CiteScore: 0.99; SJR & CiteScore Q2 on both of the Electrical & Electronics Engineering, and Computer Science) is the official publication of the Institute of Advanced Engineering and Science (IAES). The journal is open to submission from scholars and experts in the wide areas of electrical, electronics, instrumentation, control, telecommunication and computer engineering from the global world. |
Penulis | Panda, Deepak Kumar , Dash, Ranjan Kumar |
Publisher Article | Institute of Advanced Engineering and Science |
Subtitle Article | International Journal of Electrical and Computer Engineering (IJECE) Vol 7, No 1: February 2017 |
Scholar Google | http://scholar.google.com/scholar?q=%2Bintitle%3A&… |
View Article | http://ijece.iaescore.com/inde… |
DOI | https://doi.org/10.11591/ijece.v7i1… |
DOI Number | DOI: 10.11591/ijece.v7i1.pp479-485 |
Download Article [1] | http://ijece.iaescore.com/index.php/IJEC… |
Download Article [2] | http://download.garuda.ristekdikti.go.id… |
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